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RT CT-05B X-ray micron resolution test card
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Brief description:Advanced micron technology enables high-precision line-pair resolution test cards with 16 different widths (3 to 50μm). Today, microfocus is the dominant X-ray beam size, and resolution test charts are an essential tool for adjusting, setting up, inspecting, and maintaining X-ray systems.
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Detailed introduction
JapanJIMA RT CT-05B X-ray micron resolution test card
Advanced micron technology enables 16 high-precision line-pair resolution test charts in different widths (3 to 50μm). Today, microfocus is the dominant X-ray beam size, and resolution test charts are an essential tool for adjusting, setting up, inspecting, and maintaining X-ray systems.
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Specifications
Dimensions:40 x 30 mm, 3mm thickness
Silicon based:8 x 8 mm, 0.2mm thickness
Absorbent Material: Gold, Thickness≥1.0μm
Protective film: Aluminum vapor protective film, thickness 0.1mm
Number of lines:3 lines (3-10μm only: 6 lines)
Line width (line and space width are the same):
T-type layout 3, 4, 5, 6, 7, 8, 9, 10μm;
I type layout 15、20、25、30、35、40、45、50μm
Wire pair width tolerance:±10%
Working temperature:+10℃ to +70℃
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